All abstracts intended for oral presentations and submitted till May 30 were evaluated by the Scientific Advisory Committee. Abstracts selected for oral presentations are listed in the List of talks, all others have been selected for poster presentation.
Abstracts submitted after May 30 go for poster presentation.
Note that if the Scientific Advisory Committee recognizes an abstract not fulfulling the quality for an XTOP contribution, we will contact the author directly.
Note: Poster size to be displayed is of format A0 portrait.
Below you find list of contributions accepted for poster presentation.
| Benediktovitch A. | Misfit dislocation density determination at relaxation onset: reciprocal space map analysis of thin SiGe/Si layers |
| Borcha M. | Full strain tensor determination in synthesized diamonds and diamonds films |
| Borcha M. | Structure diagnostics of heterostructures and multilayered system by X-ray multiple diffraction |
| Buttard D. | In-situ GISAXS investigation of thermal and solvent annealing of high-χ block copolymers |
| Caha O. | X-ray diffraction study of topological insulator epitaxial thin films |
| Cornelius T. | In situ piezoelectric studies of PZT thin films by X-Ray microdiffraction |
| Durand A. | Fast and Accurate solution for in-line monitoring of strain field through High Resolution X-Ray Diffraction Reciprocal Space Mapping |
| Feigl L. | Time-resolved in-situ X-ray investigations during growth of InxGa1-xAs core-shell nanowire structures |
| Fernandez Herrero A. | Distinct palm-like diffuse sheets from lammellar gratings studied with small angle soft X-ray scattering |
| Fodchuk I. | Defect and magnetic structure of Y2.95La0.05Fe5O12/Gd3Ga5O12 epitaxial systems |
| Fodchuk I. | Defect structure of high-resistant CdTe crystals studied by high-resolution X-ray diffraction |
| Frentrup M. | X-ray diffraction studies of cubic GaN epilayers grown on 3C-SiC/Si |
| Gerlach A. | Structural Properties of Picene-Perfluoropentacene and Picene-Pentacene Blends: Superlattice Formation versus Limited Intermixing |
| Gokhale M. | Grazing-incidence X-ray characterization of semiconductor nanowires |
| Grenzer J. | In-situ synchrotron studies of dendrite growth in solidifying Ga–In alloys |
| Grenzer J. | Structural changes across the metal-insulator transition in thin epitaxial VO2 films |
| Haase A. | Characterization of sub-nanometer Cr/Sc multilayer systems for the water window |
| Jakob J. | In-situ time-resolved XRD and RHEED study of the polytypism in GaAs nanowires |
| Jiang J. | Structure of self-organized periodic silver dichromate rings in ultra thin film |
| Jiang J. | Visualization of inhomogeneous layers and interfaces in ultra thin films by X-ray reflectivity |
| Jones A. | Structure and Morphology of Thin Films of a BTBT Derivative: A Combined X-ray Reflectivity and AFM Study |
| Ksenzov D. | Analyse the electron and spin density profiles of a multilayer structures using wavelet transform analysis of X-ray reflectivity data |
| Lazarev S. | Influence of the applied voltage bias on the strain field in a single GaN nanowire revealed by 3D coherent X-ray diffraction |
| Lazarev S. | Ultrafast melting of polystyrene colloidal crystals investigated in pump-probe experiments at x-ray free electron laser |
| Lobach I. | Incorporation of interfacial roughness to recursion matrix formalism of dynamical x-ray diffraction in multilayers and superlattices |
| Morelhao S. | X-ray dynamical diffraction in non-periodic layered materials with large d-spacing: application to Bi2Te3 films grown on BaF2 (111) |
| Mostafavi Kashani S. | Thermal annealing and growth of a single GaAs nanowire studied by in-situ time-resolved x-ray diffraction |
| Omote K. | Grazing Incidence X-Ray Small Angle Scattering for Determining Shape of Semiconductor Device Patterns |
| Pfluger M. | From Periodic to Ordered Non-Periodic Nanostructures: GISAXS on Nanoimprinted Quasicrystals |
| Piault P. | Numerical modelling of reflective multilayer based X-ray optics |
| Roch T. | Structure of superconducting MgB2 thin films annealed in oxygen |
| Roshchin B. | X-Ray Reflectometry and scattering study of the surface nanolayers on colloidal silica |
| Rozbořil J. | In-situ X-ray diffraction annealing study on an anthradithiophene derivative |
| Shalaby e. | Synthesis, crystal structure studies and validation using X-ray powder diffraction combined with DFT calculations of bioactive derivatives. |
| Shcherbachev K. | The microstructure of Si surface layers after He+ plasma immersion ion implantation and subsequent annealing |
| Stabrawa I. | Characterization of titanium and titanium (IV) oxide nanofilms with x-ray reflectometry and grazing incident x-ray diffraction |
| Stangl J. | Si/GaP core-shell nanowires: towards direct band-gap group IV semiconductors |
| Tholapi R. | Effect of indentation induced strain on epitaxial Fe layers |
| Zaumseil P. | In-situ X-ray analysis of Nickel silicide formation |
| Zaumseil P. | X-ray analysis of strained epitaxial layers in skew geometry |
| Zaumseil P. | X-ray analysis of thermal strain release in Ge patches on Si pillars |
| Barchuk M. | XRD and TEM characterization of polar GaN layers grown by HTVPE on sapphire substrates |
| Bonnin A. | THE TOMCAT HARD X-RAY FULL FIELD TXM |
| Cejpek P. | Structure study of the shape memory alloy Ni2MnGa dopped with In |
| Cichocka M. | Structure detremination of a complex zeolite by combining rotation electron diffraction, HRTEM and PXRD |
| Cipiccia S. | Diamond Manchester beamline (I13-Imaging) at Diamond Light Source (DLS) – New Developments |
| Dopita M. | Structural studies of the growth and orientation of M- and Y-type ferrites prepared by chemical solution deposition method |
| Fodchuk I. | Long-range interaction of residual deformation fields in the X-ray triple-crystalline LLL-interferometer |
| Fodchuk I. | Skew asymmetric arrangement of X-ray diffraction for structural diagnostics of multi-layer semiconductor materials |
| Hrdý J. | The X-Ray Bi- and Multichromator – Theory and Alignment |
| Huang X. | Performing high-resolution in-plane Bragg surface diffraction using multiple-beam diffraction |
| Imai Y. | An automatic sample positioning system for nano-beam X-ray diffraction multi-scale mapping |
| Jark W. | Complete characterisation of reflection grating properties by atomic force microscopy (AFM), X-ray diffraction (XRD) and grazing incidence X-ray fluorescence analysis (GIXRF) |
| Kalasová D. | Phase contrast tomographic imaging of polymer composites |
| Kantor I. | DanMAX – The Danish beamline for in situ materials studies at MAX IV. |
| Kimura S. | High-resolution Micro- and Nano-beam Diffraction System at BL13XU of the SPring-8 |
| Korytár D. | Recent progress in design and technology of channel-cut monochromators |
| Kubec A. | Achieving point and line focus using Multilayer Laue Lenses at ESRF beamline ID13 |
| Kubec A. | Multilayer Laue Lens fabrication at Fraunhofer IWS Dresden |
| Lebugle M. | Highly efficient and tuneable silicon diffractive lenses for hard X-ray microdiffraction experiments |
| Mikhalychev A. | Simulation of resolution effects in HRXRD by semi-analytical ray-tracing |
| Mokso R. | Biomedical imaging at Max IV. |
| Nadazdy P. | Optimization of channel-cut X-ray optics for high-throughput and high-resolution laboratory small-angle X-ray scattering experiments |
| Niese S. | High precision X-ray multilayer mirrors for customized solutions |
| Pernot P. | Automated, efficient and high-throughput data acquisition at the ESRF bioSAXS beamline BM29 |
| Podurets K. | Quantitative synchrotron topography application for crystals of grooved Si and ZnGeP2 |
| Puhr B. | Structure Analysis of Drug Delivery Systems with SAXS in the Laboratory |
| Roszak K. | HIGH PRESSURE STUDY OF 3-HYDROXY-4,5-DIMETHYL-1-PHENYLPYRIDAZIN-6-ONE |
| Sakurai K. | Non-scanning X-ray fluorescence spectromicroscopy with a laboratory X-ray source |
| Stoupin S. | Complementary data from photoemission in hard x-ray reflection experiments |
| Stoupin S. | DTXRD - collection of software tools for evaluation of single crystals using x-ray diffraction |
| Šmilauerová J. | Omega phase particles in Ti – 8.1 at.% Mo alloy studied by anomalous x-ray diffraction |
| Takeya S. | Imaging and Density Estimation of Icy Materials under temperature-controlled conditions using Phase Contrast X-ray Computed Tomography |
| Tomkowiak H. | Behavior of 2-mercaptobenzimidazole under high-pressure conditions |
| Turchenko V. | Influence of high pressure and temperature on crystal structure of double perovskites |
| Turchenko V. | The influence of Y and Ce ions to changes of crystal structure of zirconia oxides |
| Turchenko V. | The refinement of atomic and magnetic structure of BaFe12–xInxO19 (x= 0.1 – 1.2) by neutron diffraction |
| Wagner U. | Coherent Diffraction based Imaging at the Diamond Light Source by utilising I13’s unique Coherence Properties |
| Zápražny Z. | High-quality active surfaces for X-ray crystal optics |
| Zatko B. | First tests of X-ray imaging using pixel detectors base on semi-insulating GaAs |
| Zolotov D. | Study of single dislocations by topo-tomography with X-ray laboratory set-up |